Department wise Equipment Procured | Year |
---|---|
CHEMICAL ENGINEERING | |
Shimadzu UV Vis Spectrophotometer (UV-1800) | 2013 |
Online SO2 Analyzer | 2015 |
Adsorption and Regeneration Reactor Column | |
Gas Absorption in Spray Tower | |
CIVIL ENGINEERING | |
STRUDS Latest Version | 2013 |
ESRGSR Latest Version | |
Shimadzu UV Vis Spectrophotometer (UV-1800) | |
Total Station | 2014 |
COMPUTER SCIENCE and ENGINEERING | |
Comprehensive LAN Security Test Bid | 2013 |
TESLA C 2070 Based System (NVIDIA Tesla C2075 Cards) | |
ELECTRICAL ENGINEERING | |
Three Phase Power Quality Analyzer (Fluke-435) | 2014 |
ELECTRONICS & COMMUNICATION ENGINEERING | |
Agilent’s ADS for RF CKT (Part No. E 8900-10327) | 2012 |
Agilent’s Golden Gate (Part No. W 2001-10021) | |
XUP Xilinx Virtex-6 Board | 2013 |
XUP Xilinx Virtex 5 Open SPARC Board | |
Xilinx Zynq- 7000 SoC Video and Imaging Kit | |
VSWR Meter | |
S-Band Microwave Test Bench | |
Advanced Microstrip Trainer Kit (MIC) | |
Keil Evaluation Board (Keil MCB STR9-ED) | |
Keil Evaluation Board (Keil MCB 2929-ED) | |
KeilUlink 2-ED USB-JTAG Interface Adapter (Keil ULINK2-ED) | |
RF Analyzer | 2015 |
MATERIALS RESEARCH CENTRE | 2014 |
AAs with Graphite Furnace (Model No. 72810004, Atomic Absorption Spectrophotometer AA-8000) | |
MECHANICAL ENGINEERING | 2015 |
Motorized Hydraulic Press | |
Pillar Type Heavy Duty Geared Power Press- H-Type | |
Surtronic 100 Surface Measuring Instrument | |
Automatic Weather Station | |
Five Gas Analyzer | |
METALLURGICAL and MATERIALS ENGINEERING | |
Q500 MC-Leica Image Analysis System (Spare Parts) | 2012 |
Microwave Furnace 1600 degree C | |
Computerized Brinell Hardness Tester | 2014 |
Computerized Vicker Hardness Tester | |
Portable Electronic Dynamic Hardness Tester | 2015 |
Differential Scanning Calorimeter (DSC) | |
Optical Microscope |